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Creators/Authors contains: "Curtis, Michael"

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  1. ; ; ; ; ; (, IEEE)
    Full Text Available 
  2. ; ; ; ; ; ; ; ; ; (, RSC Advances)
    Wafer scale transition metal dichalcogenide films grown by MOCVD using two different chalcogen precursors are assessed for layer homogeneity and quality. These characteristics are then compared to electrical properties on the growth substrate. 
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  3. ; ; ; ; ; (, Frontiers in Virtual Reality)
    null (Ed.)
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  4. ; ; ; ; ; ; ; (, ACS Applied Electronic Materials)